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PANalytical's X'Pert PRO Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for:

  1. advanced materials science and nanotechnology
  2. metrologic characterization in semiconductor process development

It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as:

  1. rocking curve analysis and reciprocal space mapping
  2. reflectometry and thin film phase analysis
  3. residual stress and texture analysis