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As thin film technology advances, semiconductor and hard disk manufacturers increasingly recognize the need for X-ray fluorescence (XRF) analysis. PANalytical's Semyos energy dispersive XRF wafer analyzer can play a vital role. The system combines PANalytical's existing thin film XRF analysis expertise with a measuring spot of less than 23 µm FWHM (full width at half maximum), enabling measurements to be made on production wafers themselves. (Details)