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Addressing the need to investigate a wide variety of materials and characterize structure and composition, the FEI QuantaTM provides flexibility and versatility to handle the challenges of today’s wide ranging research needs. View any sample and get all the data: surface and compositional images can be combined with accessories for determining material properties and elemental composition.

Today’s research extends beyond simple metals and coated samples and the Quanta series can handle challenges to produce top quality images and analysis. The Quanta 50 series from FEI is the advanced, flexible solution for current and future research applications. Featuring three imaging modes – high vacuum, low vacuum and ESEM™, it accommodates the widest range of samples of any SEM system. Characterization of both traditional samples from metals, fractures and polished sections, to non-conductive soft materials.(Detail)