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Addressing the need to investigate a wide variety of materials and characterize structure and composition, the FEI Quanta FEG provides unmatched flexibility to increase both performance and versatility to handle the challenges of today’s wide ranging research needs. View any sample and get all the data: surface images and compositional images can be combined with accessories for determining material properties and elemental composition.

Today’s research extends beyond simple metals and coated samples and the Quanta series can comfortably handle challenges to produce top quality images and analysis. The Quanta 50 series from FEI is the advanced, flexible solution for current and future research applications. Featuring three imaging modes – high vacuum, low vacuum and ESEMTM, it accommodates the widest range of samples of any SEM system. These instruments are engineered to provide maximum data – imaging and microanalysis – from all specimens, with or without preparation. Characterization of both traditional samples from metals, fractures and polished sections, to non-conductive soft materials.(Detail)