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ParticleMetric

The Phenom desktop SEM with ParticleMetric software allows easy generation and analysis of SEM images. The integrated ParticleMetric software allows the user to gather morphology and particle size data for many submicron particle applications. The fully automated measurements of ParticleMetric allow a level of visual exploration beyond optical microscopy that can lead to new discoveries and innovations in powder design, development, and quality control. 

The Phenom particle analysis solution allows users to obtain the data they need, when they need it. As a result, ParticleMetric accelerates particle analysis and improves product quality.

Key Specifications

  • Integrated software in ProSuite for online and offline analysis
  • Correlating particle features such as diameter, circularity, aspect ratio and convexity
  • Creating image datasets with free available Automated Image Mapping
  • Advanced detection algorithm with default settings for non expert user and advanced settings for experts .. (Detail)

Porometric

The Phenom desktop SEM with PoroMetric software allows easy generation and analysis of SEM images. The integrated PoroMetric software allows the user to gather data on distribution of pores, and pore parameters like pore size and aspect ratio.

Key Specifications

  • Acquire images directly from the Phenom
  • Correlate pore features such as area, aspect ratio, major and minor axis
  • Fast and convenient operation improves workflow and makes scheduling simple and predictable
  • Image collection is limitless as digital files are easily stored on a network or USB disk for data sharing, communication, or later reference

Statistical data with high-quality images .. (Detail)

Phenom XL

The Phenom XL Scanning Electron Microscope (SEM) pushes the boundaries of compact desktop SEM performance. It features the proven ease-of-use and fast time-to-image of any Phenom system.

It is also equipped with a chamber that allows analysis of large samples up to 100 mm x 100 mm. A proprietary venting/loading mechanism ensures the fastest vent/load cycle in the world, providing the highest throughput. A newly developed compact motorized stage enables the user to scan the full sample area, and yet the Phenom XL is a desktop SEM that needs little space and no extra facilities.

Ease-of-use is given an extra boost in the Phenom XL with a single-shot optical navigation camera that allows the user to move to any spot on the sample with just a single click – within seconds... (Detail)

Elemental Mapping

The Elemental Mapping & Line Scan function is an option within the EID software package. Elemental mapping reveals the distribution of elements within the sample. Here the previously selected elements for the spot analysis can be mapped at a user-specified pixel resolution and acquisition time. The real-time mapping algorithm shows live build-up of the selected element maps while storing spectra of each pixel. This allows elements to be added or removed at any time during or after the mapping process.

Mapping can be done on the image as a whole, but there is an additional benefit included to save time by adding the Selected Area option. Line Scan allows analysis over a selected line.

The key lies in the possibility to select each of the following: number of points, dwell time per point and number of passes. On top of that, the results can be easily exported and reported via an automated template.

Key Specifications

  • Fast and reliable information on the distribution of elements within the sample or the selected line
  • Easily exported and reported results  .. (Detail)

3D Reconstruction

With the 3D Roughness Reconstruction application, the Phenom desktop SEM systems are able to generate three-dimensional images and submicrometer roughness measurements. 

3D imaging helps to interpret sample characteristics and makes images understandable for a larger group of users. It is often difficult, for example, to identify dents, scratches and burrs from flat 2D images. Measuring the average roughness (Ra) and the roughness height (Rz) is critical for controlling and understanding production processes. By using SEM imaging for data collection, a much better resolution can be achieved than by using traditional (indirect) methods.

Key Specifications

  • Intuitive user interface, maximum employability
  • Intuitive fully automated user interface
  • Based on ”shape from shading” technology, no stage tilt required
  • Fast reconstruction... (details)

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