Introducing the leading solution for correlative AFM-SEM-EDX analysis
The combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM™ enables you to easily combine three of the most powerful analysis techniques available — AFM, SEM, and EDX — to greatly extend your correlative microscopy and analysis possibilities.
Topics covered include:
- Introduction and overview of the AFSEM™ system
- Compatibility to existing SEMs and additional add-ons
(e.g. tensile stages or nanoindenters)
- Recent application advances
(e.g. in-situ roughness and conductivity analysis,
correlative SEM/EDX/AFM, 3D tomography)
Experts answer application and instrumentation questions by viewers towards the end of the video.