The combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM™ enables you to easily combine three of the most powerful analysis techniques available — AFM, SEM, and EDX — to greatly extend your correlative microscopy and analysis possibilities.

This recorded webinar by Nanosurf and GETec explores the recent advances in correlative AFM-SEM-EDX analysis and shows how to combine these techniques in an interactive experiment.

Topics covered include:

• Introduction and overview of the AFSEM™ system
• Compatibility to existing SEMs and additional add-ons
  (e.g. tensile stages or nanoindenters)
• Recent application advances
  (e.g. in-situ roughness and conductivity analysis,
  correlative SEM/EDX/AFM, 3D tomography)

Experts answer application and instrumentation questions by viewers towards the end of the video.