Introduction to powder X-ray diffraction

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Better XRD data analysis and interpretation series of webinars
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In materials research, the scientist has many analytical questions related to the crystalline constitution of material samples. X-ray diffraction (XRD) is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use XRD to analyze a wide range of materials, from powder X-ray diffraction (XRPD) to solids, thin films and nanomaterials.

Interested to improve your materials characterization analysis and interpretation? Join our series of XRD webinars which are focused on helping you achieve better XRD data. This requires users to be aware about proper sampling, sample preparation, XRD instrument set up and configuration based on the type of sample you wish to analyse. Data collection is just the first step. Refining the data and making sense of its implications is crucial towards decisions regarding your research and development.

During this webinar, Dr Daniel Lee, Malvern Panalytical’s application specialist will be providing an introduction to the XRD technique. Use this session to equip yourself with a good foundation of XRD, from the theory of Braggs law through to the physics of the X-ray diffractometer. Interested to learn more? Scroll down to register your interest for our series of XRD webinars.

Summary

Date:
April 22 2020 – April 22 2020
Time:
13:00 – 14:00
(GMT+08:00) AUS Western
Event type:
Webinar – Live
Language:
English

Agenda

What will I learn?

  1. Learn about the basics of X-ray diffraction analysis for materials characterization
  2. Fundamentals to Braggs law
  3. And understand the physics to the X-ray diffractometer (as that has implications to how you prepare your sample, set up your instrument; essentially all the steps required to achieve the best data quality possible)

Speakers

Dr Daniel Lee, Malvern Panalytical’s senior application specialist for XRD, based in South Korea

Dr Lee has a PhD in Materials Science and Engineering. his expertise is on PVD, thin-film analysis, phorphors, solar cells, lithium ion batteries and thin-film battery research. He has been instrumental in providing application support using X-ray diffraction analysis to various industries including electronics, batteries, pharmaceuticals, building materials and more. These include powder diffraction, Rietveld refinement, small angle X-ray scattering, stress and texture research. Prior to joining Malvern Panalytical in 2013, he worked as a senior researcher with GS Nanotech. He was involved in the process engineering process for thin film lithium ion batteries. He also held prior appointments within the R and D team at Telio Solar Korea for CIGS solar cell development.

FAQ

Who should attend?

  • Researchers involved in materials characterization analysis who want to expand their knowledge in X-ray diffraction
  • Relevant industries include (but are not limited to) those researching on battery, powder metallurgy, cement, mining and minerals, environmental monitoring, pharmaceuticals and more
  • R+D and manufacturing leaders responsible for appropriate analytics selection
  • Scientists engaged in method development for new materials or in supporting root cause analysis investigations in support of product manufacturing

How long is this webinar?
We intend on keeping our webinars bite-sized at 20 minutes of sharing followed by time for your questions and answers. This is so you take away the key critical points for your work.
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