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X-ray fluorescence spectrometers (XRF)
Benchtop
EDXRF Epsilon 1
EDXRF Epsilon 4
Floor-Stand
WDXRF Zetium
WDXRF Axios FAST
X-ray Diffractometers (XRD)
Benchtop
Aeris
Floor-Stand
Empyrean
Fusion Machine (XRF Sample Preparation)
Claisse LeNeo
Claisse TheOx Advanced
Claisse M4
Borate Fluxes and Chemicals
Near-Infrared (NIR) Spectroscopy
ASD FieldSpec 4 Hi-Res: High Resolution Spectroradiometer
ASD TerraSpec 4 Hi-Res Mineral Spectrometer
ASD TerraSpec Halo Mineral Identifier
CNA Cross Belt Analyzers
CNA Nickel
CNA Pentos-Cement
CNA³ Cross-Belt Analyzer
X-Ray Photoelectron Spectrometer (XPS)
K-Alpha X-ray Photoelectron Spectrometer (XPS)
Nexsa G2 Surface Analysis System
ESCALAB™ QXi X-ray Photoelectron Spectrometer (XPS)
Micro Computed X-Ray Tomography (MicroCT)
HeliScan MicroCT
Scanning Electron Microscopes (SEM)
Axia ChemiSEM
Prisma E SEM
Quattro ESEM
Apreo 2 SEM
Verios 5 XHR SEM
Transmission Electron Microscopes (TEM)
Talos™ L120C TEM for Materials Science
Talos™ L120C TEM for Life Sciences
Talos™ F200i for Materials Science
Talos™ F200S TEM for Materials Science
Talos™ F200X TEM for Materials Science
Themis™ ETEM for Materials Science
Talos Arctica Cryo-TEM for Life Sciences
Cryo EM Sample Preparation with the Vitrobot System
Tundra Cryo-TEM
Glacios™ Cryo-TEM for Life Sciences
Krios G4 Cryo-TEM for Life Sciences
Krios Rx Cryo-TEM
Spectra 200 TEM
Spectra 300 TEM
Focused Ion Beam (FIB)
Aquilos 2 Cryo FIB
Helios 5 CX DualBeam for Materials Science
Helios 5 UC DualBeam for Materials Science
Helios 5 UX DualBeam for Materials Science
Helios™ G4 PFIB CXe DualBeam™ FIB/SEM for Materials Science
Helios™ G4 PFIB UXe DualBeam™ FIB/SEM for Materials Science
Helios 5 Hydra CX DualBeam
Helios 5 Hydra UX DualBeam
Scios™ 2 DualBeam™ for Materials Science
Atomic Force Microscopes (AFM)
CoreAFM
FlexAFM
NaniteAFM
LensAFM
NaioAFM
NaioSTM
Alphacen
DriveAFM
Services & Support
News & Events
Contact Us
Career
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Home
Profiles
Products
X-ray fluorescence spectrometers (XRF)
Benchtop
EDXRF Epsilon 1
EDXRF Epsilon 4
Floor-Stand
WDXRF Zetium
WDXRF Axios FAST
X-ray Diffractometers (XRD)
Benchtop
Aeris
Floor-Stand
Empyrean
Fusion Machine (XRF Sample Preparation)
Claisse LeNeo
Claisse TheOx Advanced
Claisse M4
Borate Fluxes and Chemicals
Near-Infrared (NIR) Spectroscopy
ASD FieldSpec 4 Hi-Res: High Resolution Spectroradiometer
ASD TerraSpec 4 Hi-Res Mineral Spectrometer
ASD TerraSpec Halo Mineral Identifier
CNA Cross Belt Analyzers
CNA Nickel
CNA Pentos-Cement
CNA³ Cross-Belt Analyzer
X-Ray Photoelectron Spectrometer (XPS)
K-Alpha X-ray Photoelectron Spectrometer (XPS)
Nexsa G2 Surface Analysis System
ESCALAB™ QXi X-ray Photoelectron Spectrometer (XPS)
Micro Computed X-Ray Tomography (MicroCT)
HeliScan MicroCT
Scanning Electron Microscopes (SEM)
Axia ChemiSEM
Prisma E SEM
Quattro ESEM
Apreo 2 SEM
Verios 5 XHR SEM
Transmission Electron Microscopes (TEM)
Talos™ L120C TEM for Materials Science
Talos™ L120C TEM for Life Sciences
Talos™ F200i for Materials Science
Talos™ F200S TEM for Materials Science
Talos™ F200X TEM for Materials Science
Themis™ ETEM for Materials Science
Talos Arctica Cryo-TEM for Life Sciences
Cryo EM Sample Preparation with the Vitrobot System
Tundra Cryo-TEM
Glacios™ Cryo-TEM for Life Sciences
Krios G4 Cryo-TEM for Life Sciences
Krios Rx Cryo-TEM
Spectra 200 TEM
Spectra 300 TEM
Focused Ion Beam (FIB)
Aquilos 2 Cryo FIB
Helios 5 CX DualBeam for Materials Science
Helios 5 UC DualBeam for Materials Science
Helios 5 UX DualBeam for Materials Science
Helios™ G4 PFIB CXe DualBeam™ FIB/SEM for Materials Science
Helios™ G4 PFIB UXe DualBeam™ FIB/SEM for Materials Science
Helios 5 Hydra CX DualBeam
Helios 5 Hydra UX DualBeam
Scios™ 2 DualBeam™ for Materials Science
Atomic Force Microscopes (AFM)
CoreAFM
FlexAFM
NaniteAFM
LensAFM
NaioAFM
NaioSTM
Alphacen
DriveAFM
Services & Support
News & Events
Contact Us
Career
Day:
October 8, 2022
Maulid Nabi Muhammad SAW 1444H
Maulid Nabi Muhammad 1444H
