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    • X-ray fluorescence spectrometers (XRF)
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        • WDXRF Axios FAST
    • X-ray Diffractometers (XRD)
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      • Floor-Stand
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      • ASD TerraSpec Halo Mineral Identifier
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      • Talos™ F200X TEM for Materials Science
      • Themis™ ETEM for Materials Science
      • Talos Arctica Cryo-TEM for Life Sciences
      • Cryo EM Sample Preparation with the Vitrobot System
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      • Helios 5 UC DualBeam for Materials Science
      • Helios 5 UX DualBeam for Materials Science
      • Helios™ G4 PFIB CXe DualBeam™ FIB/SEM for Materials Science
      • Helios™ G4 PFIB UXe DualBeam™ FIB/SEM for Materials Science
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Author: Admin Multiteknindo

Selamat Tahun Baru Imlek 2023

Selamat Tahun Baru Imlek, 22 Januari 2023

Pelatihan Pengoperasian dan Pengolahan Data Pola XRD dengan Software GSAS

Introduction to Analyze The Measurement of XRD Based on The Rietveld Method Using GSAS Software

Ngobrol Bareng Pakar Series 5

Potensi Hilirisasi Pertambangan di Indonesia

Selamat Hari Raya Natal!

Selamat Hari Raya Natal, 25 Desember 2022

Hari Pahlawan, 10 November 2022

Hari Pahlawan, 10 November 2022

Workshop X-Ray Diffraction (XRD)

The Measurement Technique and Data Interpretation of X-Ray Diffraction using Highscore Plus (Hands-On) in Mineral Analysis

Sumpah Pemuda ke-94, 28 Oktober 2022

Sumpah Pemuda ke-94, 28 Oktober 2022

Maulid Nabi Muhammad SAW 1444H

Maulid Nabi Muhammad 1444H

Seminar & Live Demo

Solution for Mineral Analysis using The Latest Technology WDXRF

Ngobrol Bareng Pakar Series 4

Perkembangan Industri Logam di Indonesia dan Peran Alat Uji Karakterisasinya

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