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  • Profiles
  • Products
    • X-ray fluorescence spectrometers (XRF)
      • Benchtop
        • EDXRF Epsilon 1
        • EDXRF Epsilon 4
      • Floor-Stand
        • WDXRF Zetium
        • WDXRF Axios FAST
    • X-ray Diffractometers (XRD)
      • Benchtop
        • Aeris
      • Floor-Stand
        • Empyrean
    • Fusion Machine (XRF Sample Preparation)
      • Claisse LeNeo
      • Claisse TheOx Advanced
      • Claisse M4
      • Borate Fluxes and Chemicals
    • Near-Infrared (NIR) Spectroscopy
      • ASD FieldSpec 4 Hi-Res: High Resolution Spectroradiometer
      • ASD TerraSpec 4 Hi-Res Mineral Spectrometer
      • ASD TerraSpec Halo Mineral Identifier
    • CNA Cross Belt Analyzers
      • CNA Nickel
      • CNA Pentos-Cement
      • CNA³ Cross-Belt Analyzer
    • X-Ray Photoelectron Spectrometer (XPS)
      • K-Alpha X-ray Photoelectron Spectrometer (XPS)
      • Nexsa G2 Surface Analysis System
      • ESCALAB™ QXi X-ray Photoelectron Spectrometer (XPS)
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      • Talos™ L120C TEM for Life Sciences
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      • Talos™ F200X TEM for Materials Science
      • Themis™ ETEM for Materials Science
      • Talos Arctica Cryo-TEM for Life Sciences
      • Cryo EM Sample Preparation with the Vitrobot System
      • Tundra Cryo-TEM
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      • Krios G4 Cryo-TEM for Life Sciences
      • Krios Rx Cryo-TEM
      • Spectra 200 TEM
      • Spectra 300 TEM
    • Focused Ion Beam (FIB)
      • Aquilos 2 Cryo FIB
      • Helios 5 CX DualBeam for Materials Science
      • Helios 5 UC DualBeam for Materials Science
      • Helios 5 UX DualBeam for Materials Science
      • Helios™ G4 PFIB CXe DualBeam™ FIB/SEM for Materials Science
      • Helios™ G4 PFIB UXe DualBeam™ FIB/SEM for Materials Science
      • Helios 5 Hydra CX DualBeam
      • Helios 5 Hydra UX DualBeam
      • Scios™ 2 DualBeam™ for Materials Science
    • Atomic Force Microscopes (AFM)
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Author: Admin Multiteknindo

Workshop X-Ray Diffraction (XRD)

The Measurement Technique and Data Interpretation of X-Ray Diffraction using Highscore Plus (Hands-On) in Mineral Analysis

Sumpah Pemuda ke-94, 28 Oktober 2022

Sumpah Pemuda ke-94, 28 Oktober 2022

Maulid Nabi Muhammad SAW 1444H

Maulid Nabi Muhammad 1444H

Seminar & Live Demo

Solution for Mineral Analysis using The Latest Technology WDXRF

Ngobrol Bareng Pakar Series 4

Perkembangan Industri Logam di Indonesia dan Peran Alat Uji Karakterisasinya

Malvern Panalytical at LabIndonesia

Visit Malvern Panalytical booth at LabIndonesia 7-9 September 2022

Metode Uji Kegagalan dengan Menggunakan SEM

Metode Uji Kegagalan (Failure Analysis) dengan Menggunakan Scanning Electron Microscopy (SEM)

Material Characterization Using SEM in The Field of Welding

Webinar Material Characterization Using SEM (Scanning Electron Microscope) in The Field of Welding

Training Ahli Pratama X-Ray Flourescence Spectrometry Batch 2 & Sertifikasi International (SNI ISO/IEC 17024:2012) Certified International Operator for XRF (CIO-XRF)

Ahli Pratama X-Ray Fluorescence Spectrometry Batch 2 & Sertifikasi International (SNI ISO/IEC 17024:2012) Certified International Operator for XRF (CIO-XRF)

Ngobrol Bareng Pakar Seri 3

Ngobrol Bareng Pakar Seri 3 | Material untuk Energi Terbarukan, Peran Alat Uji dan Karakterisasinya

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