Helios G4 FX DualBeam for Materials Science

Fastest time to useful data with unique all-in-one solution.

The Thermo Scientific Helios G4 FX DualBeam™ microscope is the world’s first DualBeam to incorporate a TEM-like CompuStage for TEM lamella sample preparation and combine it with an all new In-lens STEM 4 detector to drastically reduce the time to high quality useable data. The integrated CompuStage is included in standard configuration and independent of the bulk stage and comes with separate X, Y, Z, eucentric 180° alpha tilt and 200° beta tilt axes enabling SEM endpointing on both sides of the TEM lamella. The accompanying STEM rod is compatible with standard 3 mm TEM grids and enables fast grid exchange without breaking vacuum. In addition, the system is equipped with a retractable, annular STEM 4 detector with new In-lens mode for ultimate imaging performance and sub-3Å resolution.