Prisma E SEM for Materials Science

The most complete SEM for multi-user laboratories requiring all-round performance and ease-of-use

The new Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM

Easy Navigation

Finding the region of interest or even finding the sample itself can be a tedious task… but not on Prisma E. The in-chamber navigation camera (Nav-Cam) provides a detailed photo of the sample holder, which makes it easy to work with multiple samples in one session and to navigate to them one by one. Within a sample, you’ll go to the region of interest by simply clicking it. The Nav-cam image rotates along with the sample, so that navigation is truly intuitive.

Excellent imaging

The Apreo SEM’s revolutionary compound lens design combines electrostatic and magnetic immersion technology to yield unprecedented resolution and signal selection. Its unique detector system, high-pressure low-vacuum mode, and smart scanning offer many strategies for dealing with challenging samples. This versatility makes the Apreo SEM the platform of choice for research on nanoparticles, catalysts, powders, and nanodevices, without compromising on magnetic sample performance

Prisma works equally well on traditional samples (steel with inclusion, 15 kV, high vacuum)

as on insulating or sensitive samples. Paper (wood) is an electrical insulator – it was imaged in low vacuum (90 Pa) to prevent charging. Prisma’s ability to also work at low beam energy (1.5 kV in this image), even when in low vacuum, enables extraction of true surface information.

Simultaneous detection of topographic (left) and compositional (middle) information provides all sample information in a single scan of the electron beam. The topographic and compositional data are combined in one image (right) that shows all information.
Sample: polymer-metal composite