Spectra 200 TEM and STEM
High throughput TEM & STEM microscope for all materials science applications.
For scientists to advance their understanding of complex samples and develop innovative materials, they must have access to robust, precise instrumentation capable of correlating form and function, as well as resolving space, time and frequency.
Thermo Fisher Scientific introduces the Thermo Scientific Spectra 200 Scanning Transmission Electron Microscope (S/TEM), the high-throughput, aberration-corrected, scanning transmission electron microscope for all materials science applications.
All Spectra 200 S/TEMs are delivered on new platforms designed to offer an unprecedented level of mechanical stability and highest imaging quality though passive and (optional) active vibration isolation.
The system is housed in a fully re-designed enclosure with a built-in on-screen display for convenient specimen loading and removal. For the first time, full modularity and upgradeability can be offered between uncorrected and single-corrected configurations with variable heights, allowing maximum flexibility for different room configurations.
- Powered by the ultra-high-brightness cold field emission gun (X-CFEG)
- High-resolution STEM imaging performance for all accelerating voltages
- Unprecedented sensitivity with the Panther STEM detection system
- Advanced STEM imaging capabilities
- New possibilities in STEM analytics with Spectra 200 S/TEM
|Spectra 200 S/TEM|
|Analytics and detectors|
|Available detector options|