Spectra 200 TEM and STEM

High throughput TEM & STEM microscope for all materials science applications.

For scientists to advance their understanding of complex samples and develop innovative materials, they must have access to robust, precise instrumentation capable of correlating form and function, as well as resolving space, time and frequency.

Thermo Fisher Scientific introduces the Thermo Scientific Spectra 200 Scanning Transmission Electron Microscope (S/TEM), the high-throughput, aberration-corrected, scanning transmission electron microscope for all materials science applications.

All Spectra 200 S/TEMs are delivered on new platforms designed to offer an unprecedented level of mechanical stability and highest imaging quality though passive and (optional) active vibration isolation.

The system is housed in a fully re-designed enclosure with a built-in on-screen display for convenient specimen loading and removal. For the first time, full modularity and upgradeability can be offered between uncorrected and single-corrected configurations with variable heights, allowing maximum flexibility for different room configurations.

Key Features

  • Powered by the ultra-high-brightness cold field emission gun (X-CFEG)
  • High-resolution STEM imaging performance for all accelerating voltages
  • Unprecedented sensitivity with the Panther STEM detection system
  • Advanced STEM imaging capabilities
  • New possibilities in STEM analytics with Spectra 200 S/TEM


Spectra 200 S/TEM
  • Probe corrector:
    • Energy spread: 0.4 eV
    • Information limit: 110 pm
    • STEM resolution: 60 pm (136 pm @ 30 kV)
  • Uncorrected:
    • Energy spread: 0.4 eV
    • Information limit: 110 pm
    • STEM resolution: 164 pm
  • X-CFEG: Ultra-high-brightness cold field emission gun with energy resolution of <0.4 eV
  • Flexible high-tension range from 30 – 200 kV
Analytics and detectors
  • Super-X/Dual-X EDS options, integrated software, and the Gatan Ultrafast EELS/DualEELS options together provide up to 1000 sp/s of simultaneous EDS and EELS data acquisition
  • Analytics for live peak identification and background fitting during ultra-fast EDS acquisition
  • Symmetric EDS detector design allows for combined tomographic EDS
Available detector options
  • HAADF detector
  • On-axis solid state, 8 segmented BF and ADF detectors (16 segments in total)
  • Thermo Scientific Ceta 16M Camera (optionally with speed enhancement)
  • Gatan OneView/OneView IS cameras
  • Gatan energy filter series
  • Electron microscope pixel array detector (EMPAD)