Spectra 300 High Resolution TEM and STEM

High Resolution TEM & STEM microscope for all materials science applications.

For scientists to advance their understanding of complex samples and develop innovative materials, they must have access to robust, precise instrumentation capable of correlating form and function, as well as resolving space, time and frequency.

Thermo Fisher Scientific introduces the Thermo Scientific Spectra 300 S/TEM – the highest resolution, aberration corrected, scanning transmission electron microscope for all materials science applications.

Built on an ultra-stable foundation

All Spectra 300 S/TEMs are delivered on new platforms designed to offer an unprecedented level of mechanical stability and highest imaging quality though passive and (optional) active vibration isolation.

The system is housed in a fully redesigned enclosure with a built-in on-screen display for convenient specimen loading and removal. For the first time, full modularity and upgradeability can be offered between uncorrected and single-corrected configurations with variable heights, allowing maximum flexibility for different room configurations.

Spectra 300 S/TEM: A redesigned base and enclosure deliver the highest imaging quality though passive and (optional) active vibration isolation.

Key Features

  • High energy resolution sources available on the Spectra 300 S/TEM
  • Configurable with the ultra-high brightness X-CFEG source
  • Providing the highest resolution STEM imaging performance
  • Unprecedented sensitivity with the Panther STEM detection system
  • Advanced STEM imaging capabilities
  • Spectroscopic flexibility with the Spectra 300 S/TEM
  • In situ capabilities of the Spectra 300 S/TEM

Specifications

Image corrector

  • Energy spread: 0.2–0.3 eV
  • Information limit: 60 pm
  • STEM resolution: 136 pm

Probe corrector

  • Energy spread: 0.2–0.3 eV
  • Information limit: 100 pm
  • STEM resolution: 50 pm (125 pm @ 30 kV)

Uncorrected

  • Energy spread: 0.2–0.3 eV
  • Information limit: 100 pm
  • STEM resolution: 136 pm

X-FEG/monochromator double corrected (probe+image corrector

  • Energy spread: 0.2–0.3 eV
  • Information limit: 60 pm
  • STEM resolution: 50 pm (125 pm @ 30 kV)

X-CFEG double-corrected (probe+image correction) 

  • Energy spread: 0.4 eV
  • Information limit: 60 pm
  • STEM resolution: 50 pm (125 pm @ 30 kV)

Source

  • X-FEG Mono: High-brightness Schottky field emitter gun and monochromator with a tunable energy resolution range between 1 eV and <0.2 eV
  • X-FEG UltiMono: High-brightness Schottky field emitter gun with ultra-stable monochromator and accelerating voltage with a tunable energy resolution range between 1eV and <0.03 eV
  • X-CFEG: Ultra-high brightness with an intrinsic energy resolution of <0.4 eV
  • Flexible high-tension range from 30 – 300 kV