Demo: MFM with the CoreAFM

Demo: MFM with the CoreAFM

Demo: Magnetic Force Microscopy (MFM) with the CoreAFM

This is a recording of the demonstration the use of the Nanosurf CoreAFM for Magnetic Force Microscopy (MFM). Dr. Denis Vasyukov, application scientist, conducts the demonstration during which he demonstrates how to obtain MFM data on a CoreAFM. The demo addresses operation in both single and dual pass modes. In single pass, the MFM signal is measured at a constant height and thus there is no topography information. In dual pass mode, each scanline is scanned twice, once to obtain topography and then to collect the MFM signal.

Other Nanosurf Webinar

Demo: Alphacen 300 – AFM for large and heavy samples

Demo: Alphacen 300 – AFM for large and heavy samples

Demo: Alphacen 300 - AFM for large and heavy samples

This is a recording of the demonstration about Alphacen 300, the large sample AFM from Nanosurf. Dr. Christian Bippes, Application scientist conducts the demonstration during which he highlights the features of the Alphacen 300. The Alphacen 300 system can access a sample area of 300 mm x 300 mm. The system is designed to handle large and heavy samples (up to 45kg). During this demo, Dr. Bippes shows how the Alphacen 300 is operated, including sample loading, approach and imaging of a sample surface.

Other Nanosurf Webinar

Demo: KPFM with the CoreAFM

Demo: KPFM with the CoreAFM

Demo: KPFM with the CoreAFM

AFM is far more powerful than a mere 3-D topographic mapping tool and can explore a wide variety of surface properties. In this webinar we describe the various properties it can measure—still all on the nanoscale and in conjunction with topography—including mechanical properties, magnetic properties, electrical properties, and specialized measurements in fluids.

Other Nanosurf Webinar

Demo: Force spectroscopy for Nanomechanical measurements

Demo: Force spectroscopy for Nanomechanical measurements

Live demo: Force spectroscopy for Nanomechanical measurements

In this video on the use of force curves to measure nano mechanical properties of soft materials, Dr. Patrick Frederix, application scientist, shows how to setup and measure force curves on a FlexAFM. He compares force curves obtained on two different polymers and discusses how we can deduce the nanomechanical properties from these force curves.

Other Nanosurf Webinar

Demo: Imaging 2D Materials with the FlexAFM

Demo: Imaging 2D Materials with the FlexAFM

Demo: Imaging 2D Materials with the FlexAFM

Dr. Edward Nelson, Technical Support specialist, conduct a demonstration during which he highlights the capabilities of the FlexAFM and its ease of use. If you are an existing Nanosurf AFM user who could use some additional training, considering the purchase of a new AFM or simply curious of how an AFM can be used to study 2D materials, this demo is for you.

Other Nanosurf Webinar

More than topography: What else can AFM measure?

More than topography: What else can AFM measure?

More than topography: What else can AFM measure?

AFM is far more powerful than a mere 3-D topographic mapping tool and can explore a wide variety of surface properties. In this webinar we describe the various properties it can measure—still all on the nanoscale and in conjunction with topography—including mechanical properties, magnetic properties, electrical properties, and specialized measurements in fluids.

Other Nanosurf Webinar

What is the right instrument for investigating my surface at the nanoscale?

What is the right instrument for investigating my surface at the nanoscale?

What is the right instrument for investigating my surface at the nanoscale?

Choosing the right instrument or technique to examine your sample at the nanoscale can be a confusing and challenging exercise. In this talk, we discuss the four most common systems available in the research lab today for imaging, characterizing and measuring surfaces at the micro and nanoscale; electron microscopy (SEM), AFM, optical profilometry and stylus profilometry.

We outline the best practice use cases for each category, the limits of each technology, provide relevant examples of where one may choose one technique versus another, and demonstrate why often multiple systems are required to fully understand one’s sample. We also take a more in depth look at how AFM as a technique bridges the gap between imaging and metrology at the nanoscale and why it should be considered an essential part of any materials science, chemistry, physics or imaging laboratory.

Other Nanosurf Webinar

Single Cell Injection, Deposition and Aspiration

Single Cell Injection, Deposition and Aspiration

Single Cell Injection, Deposition and Aspiration - Force controlled manipulation with FluidFM®

One of the challenges in single cell biology is to address and manipulate single cells locally while being able to monitor their reaction after the manipulation.

One possibility is to use glass pipettes with micromanipulators. However, this technique does not include any form of force feedback, and it is unforgiving if a cell is touched in the process – both the cell and the manipulator are easily damaged.

FluidFM is a flexible structure that features force control, making it possible to manipulate a cell without damaging it, even when coming into contact with the tool.

This webinar will give an overview of the current research possibilities using FluidFM technology in the areas of single cell injection, extraction, and deposition, with sub-picoliter accuracy. You will learn about advantages of single cell manipulation compared to whole colony experiments. The speakers will cover applications like virus deposition, chemical stimulation of cells and tissues as well as injection into or extraction from single cells for enzyme activity assays or mass spectrometry.

Experts from the field and from Nanosurf will be standing by to help you understand how to conduct your research using this cutting-edge technology.

Other Nanosurf Webinar

AFSEM™ webinar

AFSEM™ webinar

Introducing the leading solution for correlative AFM-SEM-EDX analysis

The combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM™ enables you to easily combine three of the most powerful analysis techniques available — AFM, SEM, and EDX — to greatly extend your correlative microscopy and analysis possibilities.

This recorded webinar by Nanosurf and GETec explores the recent advances in correlative AFM-SEM-EDX analysis and shows how to combine these techniques in an interactive experiment.

Topics covered include:

  • Introduction and overview of the AFSEM™ system
  • Compatibility to existing SEMs and additional add-ons
    (e.g. tensile stages or nanoindenters)
  • Recent application advances
    (e.g. in-situ roughness and conductivity analysis,
    correlative SEM/EDX/AFM, 3D tomography)

Experts answer application and instrumentation questions by viewers towards the end of the video.

Other Nanosurf Webinar