- Products
- X-ray fluorescence spectrometers (XRF)
- X-ray Diffractometers (XRD)
- Fusion Machine (XRF Sample Preparation)
- Near-Infrared (NIR) Spectroscopy
- CNA Cross Belt Analyzers
- X-Ray Photoelectron Spectrometer (XPS)
- Micro Computed X-Ray Tomography (MicroCT)
- Scanning Electron Microscopes (SEM)
- Transmission Electron Microscopes (TEM)
- Talos™ L120C TEM for Materials Science
- Talos™ L120C TEM for Life Sciences
- Talos™ F200i for Materials Science
- Talos™ F200S TEM for Materials Science
- Talos™ F200X TEM for Materials Science
- Themis™ ETEM for Materials Science
- Talos Arctica Cryo-TEM for Life Sciences
- Cryo EM Sample Preparation with the Vitrobot System
- Tundra Cryo-TEM
- Glacios™ Cryo-TEM for Life Sciences
- Krios G4 Cryo-TEM for Life Sciences
- Krios Rx Cryo-TEM
- Spectra 200 TEM
- Spectra 300 TEM
- Focused Ion Beam (FIB)
- Aquilos 2 Cryo FIB
- Helios 5 CX DualBeam for Materials Science
- Helios 5 UC DualBeam for Materials Science
- Helios 5 UX DualBeam for Materials Science
- Helios™ G4 PFIB CXe DualBeam™ FIB/SEM for Materials Science
- Helios™ G4 PFIB UXe DualBeam™ FIB/SEM for Materials Science
- Helios 5 Hydra CX DualBeam
- Helios 5 Hydra UX DualBeam
- Scios™ 2 DualBeam™ for Materials Science
- Atomic Force Microscopes (AFM)